Wafer Sort
TestEdge offers complete wafer sort solutions. Our range of wafer sort capabilities demonstrates our ability to handle a wide range of devices and device characteristics.

  • Sort experience with high probe count
  • Less than 4 mil pitch on probes
  • Experience with C4 Bump and Aluminum pad
  • Experience on Bipolar, CMOS, GaAs, & SiGe
  • Overhead sort or cable harness sort
  • Microsite testing capability
  • shim.gif wafer.gif




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