RF Device Life Test Services We have partnered with Accel-RF Corporation to provide accelerated life and burn-in testing on a variety of RF and microwave components. The in-house Accel-RF systems provide fully automated temperature, DC, and RF bias conditions to each device under test, along with parametric measurements, limits monitoring, datalogging, and analysis. Components that can be tested include: FET's GaAs Devices Monolithic Microwave IC's Hybrid Microwave IC's Microwave Module Assemblies By monitoring total DC and RF power to and from the device and adjusting the case temperature as required, accurate junction temperature is maintained, resulting in accurate life expectancy results or burn-in conditions. Devices are also protected from thermal runaway and other destructive conditions, to facilitate post life failure analysis. Services include test consultation and strategy, fixture design and fabrication, test setup and monitoring, and data analysis and report generation. For further information on the Accel-RF system, please take a look at the Accel-RF System Technical Brief.

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