The Problem Successful circuit design requires focused parametric measurements across a broad set of conditions. The practice of test generates huge quantities of data. And, financial priorities drive the order (rather disorder) of development. So, how can one retrieve focused and insightful information from a sea of data?
	The Solution Relational databases are the method of choice for organizing data. TestEdge has married the standard relational database with important functions geared toward IC test: Automated parser-loaders for common ATE Comfortable user interface via web browser Data retrieval with or without sql programming Powerful graphic renderings like ones shown Script-automated complex extractions Convenient information distribution via email Parsing & Loading TestEdge has developed parsers for popular ATE tester formats. These parsers are script level and quickly tunable to new formats. Parsers are loosely coupled to the database loader to ensure the records are unduplicated, complete and valid. Data is easily overridden with subsequent reloads. And all loads are fully backed up. The User Interface TestEdge has chosen the web browser as the user interface. It provides a form driven dialog between user and database to accomplish a wide variety of tasks. Data exploration with no previous tutoring Focused extraction to isolate useful conditions Discrete and aggregate extraction Tabular and graphic presentation Histogram and boxplot graphic presentation Convenient information distribution via email Take A Guided Tour

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